CE-753: Testability

Last updated: Sunday, September 26, 2010

Course Information

Instructor: Shaahin Hessabi (E-mail: hessabi@sharif.edu)

Textbook: Bushnell and Agrawal, Essentials of Electronic Testing: Digital, Analog, and Mixed-Signal, Kluwer Academic Publishers, Boston, 2002.

Credits: 3 Units

Lecture Time: Sundays and Tuesdays: 10:30-11:50 AM

Grading schedule: midterm (30%), projects (30%), Final (40%)

For passing the course, three conditions must be met:
    a) total grade greater than 50%, 60 %, and 70% for B.Sc., M.Sc., and Ph.D. students, respectively;
    b) obtaining at least 40% of the final exam's grade;
    c) obtaining at least 40% of project's grade.

Projects (will be announced in courseware)

Lecture Notes. I will use the lecture notes prepared by the book authors, available from http://www.caip.rutgers.edu/~bushnell/testbook.html

A modified version of these lecture notes will be used in class, available for students who have enrolled in class (http://cw.sharif.edu)

Topic

Introduction

Test Process and ATE

Test Economics

Yield Analysis & Product Quality

Fault Modeling

Logic Simulation

Fault Simulation

Testability Measures

First Midterm Exam

Combinational ATPG Basics

Redundancy Removal using ATPG

Major Combinational ATPG Algorithms

Advanced Combinational ATPG Algorithms

Design for Testability - Full Scan

Design for Testability - Partial Scan

BIST Pattern Generation & Response Compaction, BIST Architectures

IEEE 1149.1 Boundary Scan Standard

scanedu software

Project presentations

Exams

Office Hours

Saturdays: 3-4:30 PM
Mondays: 10:30-11:50 AM
Sundays: 4:30-5:30 PM

Please make an appointment if consultation at a different time is needed. hessabi@sharif.edu