Instructor: Shaahin
Hessabi (E-mail: hessabi@sharif.edu)
Textbook: Bushnell and Agrawal, Essentials of
Electronic Testing: Digital, Analog, and Mixed-Signal, Kluwer Academic
Press, Boston, 2000.
Credits: 3 Units
Lecture Time: Sundays and Tuesdays: 10:30-11:50 AM
Grading schedule: midterms (30%), projects (30%),
Final (40%)
For passing the course, three conditions must
be met:
a) total grade greater than 50%, 60 %, and 70% for B.Sc.,
M.Sc., and Ph.D. students, respectively;
b) obtaining at least 40% of final exam's grade;
c) obtaining at least 40% of project's grade.
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|
Topic |
Date |
|
Introduction |
31st of Shahrivar |
|
Test Process and ATE |
2nd of Mehr |
|
Test Economics |
7th of Mehr |
|
Yield Analysis & Product Quality |
9th of Mehr |
|
Fault Modeling |
14th of Mehr |
|
Logic Simulation |
16th and 21st of Mehr |
|
Fault Simulation |
23rd and 25th of Mehr |
|
Testability Measures |
30th of Mehr |
|
Combinational ATPG Basics |
5th of Aban |
|
First Midterm Exam |
7th of Aban |
|
Redundancy Removal using ATPG |
12th of Aban |
|
Major Combinational ATPG Algorithms, Advanced
Combinational ATPG Algorithms |
14th and 19th of Aban |
|
Sequential Circuit ATPG |
21st of Aban |
|
Design for Testability - Full Scan |
26th and 28th of Aban |
|
Sample midterm solution, project announcement |
3rd of Azar |
|
Second Midterm Exam |
5th of Azar |
|
Design for Testability - Partial Scan |
10th of Azar |
|
BIST Pattern Generation & Response Compaction, BIST
Architectures |
12th and 17th of Azar |
|
IEEE 1149.1 Boundary Scan Standard |
24th of Azar |
|
scanedu software |
26th of Azar |
|
Project presentations |
1st to 3rd of Day |
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Saturdays: 9-10 AM, 3-4:30 PM
Sundays: 1:30-3 PM
Mondays: 10:30-11:50 AM
Please make an appointment if consultation at a different time is needed. hessabi@sharif.edu